000 02140nas a2200541zi 4500
001 000012736
005 20220228105732.0
008 010508c19639999xxuqn_p_d_________a_eng_d
022 _a0018-9529
030 _aIEERAJ
035 _aSER01000012736
040 _aUNAMX
_bspa
_erda
_cUNAMX
041 _aeng
050 1 4 _aTK7800
082 1 4 _a621.38
210 1 _aIEEE trans. reliab.
222 0 0 _aIEEE transactions on reliability
245 0 0 _aIEEE transactions on reliability
246 1 0 _aInstitute of Electrical and Electronics Engineers transactions on reliability
246 1 0 _aTransactions on reliability
246 1 0 _aReliability (New York, N.Y.)
264 1 _aNew York, N.Y. :
_bIEEE,
_c1963-
310 _aCinco numeros al año
321 _aIrregular
336 _atexto
_2rdacontent
337 _asin medio
_2rdamedia
338 _avolumen
_2rdacarrier
500 _aInicia en 1963 con el vol. R-12, no. 1
510 0 _aApplied science & technology index
510 0 _aChemical abstracts
510 0 _aCurrent contents
510 0 _aEngineering index
510 0 _aMathematical reviews
510 0 _aSocial science citation index
510 0 _aScience abstracts
510 0 _aNuclear science abstracts
510 0 _aInternational aerospace abstracts
530 _aTambien disponible en microficha
530 _aTambien disponible en CD-ROM
550 0 _aVols. de 1963- publicados por Institute of Electrical and Electronics Engineers, Professional Technical Group on Reliability: oct. 1975- por IEEE Reliability Group; 1979- por IEEE Reliability Society
550 0 _aVol. de 1975- tambien publicado como la revista de Electronics Division, American Society for Quality Control
650 4 _aIndustrias electrónicas
_xControl de calidad.
710 2 1 _aInstitute of Electrical and Electronics Engineers.
_bProfessional Technical Geoup on Reliability
710 2 1 _aIEEE Reliability Group
710 2 1 _aIEEE Reliability Society
710 2 1 _aAmerican Society for Quality Control.
_bElectronics Division
780 0 0 _tIRE transactions on reliability and quality control
_x0097-4552
999 _c39683
_d39683