000 00607nam a2200193zi 4500
005 20220228104408.0
008 970106q19001999 y 000 0 eng d
035 _aMX001000143697
050 _aTA168
_bI57
110 _aInstitute Of Electrical And Electronics Enginnering, Electron Devices Group.
245 1 0 _aReliability physics :
_bAnnual proceedings.
264 1 _aNew York :
_bIEEE,
_c[19--]
300 _avolúmenes
650 4 _aConfiabilidad (Ingeniería)
336 _atexto
_2rdacontent
337 _asin medio
_2rdamedia
338 _avolumen
_2rdacarrier
999 _c3797
_d3797