| 000 | 01209nam a2200301zi 4500 | ||
|---|---|---|---|
| 005 | 20220228105253.0 | ||
| 008 | 100223s2008 ne a 000 0 eng | ||
| 020 | _a9780123739735 (empastado, cubierta dura : papel alcalino) | ||
| 020 | _a012373973X (empastado, cubierta dura : papel alcalino) | ||
| 035 | _aMX001001204774 | ||
| 040 |
_aDLC _bspa _cDLC _dBAKER _dBTCTA _dYDXCP _dC#P _dDLC _dUNAMX |
||
| 050 | 0 | 0 |
_aTK7895.E42 _bS98 |
| 082 | 0 | 0 |
_a621.39/5 _222 |
| 245 | 0 | 0 |
_aSystem-on-chip test architectures : _bnanometer design for testability / _cedited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba |
| 264 | 1 |
_aAmsterdam : _bM. Kaufmann, _c2008 |
|
| 300 |
_axxxvi, 856 páginas : _bilustraciones |
||
| 490 | 0 | _aThe Morgan Kaufmann series in systems on silicon | |
| 650 | 0 |
_aSistemas en un chip _xPruebas |
|
| 650 | 0 |
_aCircuitos integrados en muy gran escala _xPruebas |
|
| 650 | 0 |
_aCircuitos integrados en muy gran escala _xDiseño |
|
| 700 | 1 |
_aWang, Laung-Terng, _eeditor |
|
| 700 | 1 |
_aStroud, Charles E., _eeditor |
|
| 700 | 1 |
_aTouba, Nur A., _eeditor |
|
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c35284 _d35284 |
||