| 000 | 00935nam a2200289zi 4500 | ||
|---|---|---|---|
| 005 | 20220228105253.0 | ||
| 008 | 100222s2010 ne a 000 0 eng d | ||
| 020 | _a9780080964546 (encuadernado) | ||
| 020 | _a0080964540 (encuadernado) | ||
| 035 | _aMX001001204530 | ||
| 040 |
_aUKM _bspa _cUKM _dBWK _dYDX _dTXA _dUNAMX |
||
| 050 | 4 |
_aTA174.7 _bL43 |
|
| 082 | 0 |
_a620.50287 _222 |
|
| 100 | 1 |
_aLeach, Richard K., _eautor |
|
| 245 | 1 | 0 |
_aFundamental principles of engineering nanometrology / _cRichard K. Leach |
| 264 | 1 |
_aAmsterdam ; _bW. Andrew, _bElsevier : _cc2010 |
|
| 300 |
_axxvi, 321 páginas : _bilustraciones |
||
| 490 | 0 | _aMicro and nano technologies | |
| 650 | 4 | _aNanotecnología | |
| 650 | 4 | _aMicrotecnología | |
| 650 | 4 | _aMetrología | |
| 830 | 0 | _aMicro & nano technologies | |
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 999 |
_c35279 _d35279 |
||