| 000 | 01195nam a2200289zi 4500 | ||
|---|---|---|---|
| 005 | 20220228105228.0 | ||
| 008 | 060728s2006 ne a 000 0 eng | ||
| 020 | _a0123705975 (encuadernado en tela : papel alcalino) | ||
| 020 | _a978-0-12-370597-6 (encuadernado en tela : papel alcalino) | ||
| 035 | _aMX001001105041 | ||
| 040 |
_aDLC _bspa _cDLC _dBAKER _dC#P _dIXA _dDLC _dUNAMX |
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| 050 | 0 |
_aTK7874.75 _bV5767 |
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| 082 | 0 | 0 |
_a621.39/5 _222 |
| 245 | 0 | 0 |
_aVLSI test principles and architectures : _bdesign for testability / _cedited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen |
| 264 | 1 |
_aAmsterdam : _bElsevier ; _aSan Francisco, California : _bMorgan kaufmann, _cc2006 |
|
| 300 |
_axxx, 777 páginas : _bilustraciones |
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| 490 | 0 | _aThe Morgan Kaufmann series in systems on silicon | |
| 650 | 0 |
_aCircuitos integrados en muy gran escala _xPruebas |
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| 650 | 0 |
_aCircuitos integrados en muy gran escala _xDiseño y construcción |
|
| 700 | 1 |
_aWang, Laung-Terng, _eeditor |
|
| 700 | 1 |
_aWu, Cheng-Wen, _eeditor |
|
| 700 | 1 |
_aWen, Xiaoqing, _eeditor |
|
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c33861 _d33861 |
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