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| 005 | 20220228105149.0 | ||
| 008 | 040521c 1997njua b 001 0 eng | ||
| 020 | _a0780310004 | ||
| 035 | _aMX001000997460 | ||
| 040 |
_aDLC _bspa _cDLC _dC#P _dUNAMX |
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| 041 | _aENG | ||
| 050 | 0 | 0 |
_aTK7895.M4 _bS46 |
| 100 | 1 |
_aSharma, Ashok K., _eautor |
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| 245 | 1 | 0 |
_aSemiconductor memories : _btechnology, testing, and reliability / _cAshok K. Sharma |
| 264 | 1 |
_aPiscataway, New York : _bIEEE ; _aNew Jersey : _bJ. Wiley, _cc1997 |
|
| 300 |
_axii, 462 páginas : _bilustraciones |
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| 500 | _a"IEEE order number: PC3491"--Tomado de la cubiert a | ||
| 500 | _a"IEEE Solid-State Circuits Council, sponsor" | ||
| 650 | 0 | _aMemorias de semiconductores | |
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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_c31589 _d31589 |
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