| 000 | 00783nam a2200229 a 4500 | ||
|---|---|---|---|
| 008 | 030704c^^^^2003njua^^^^^b^^^^000^0^eng^^ | ||
| 020 | _a0-471-39761-X (papel libre de acido) | ||
| 035 | _aMX001000964970 | ||
| 040 |
_aDLC _bspa _cDLC _dUKM _dUNAMX |
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| 041 | _aENG | ||
| 050 | 0 | 0 |
_aTA169 _bK86 |
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_a620/.00452 _221 |
| 100 | 1 |
_aKuo, Way, _d1951- _eautor |
|
| 245 | 1 | 0 |
_aOptimal reliability modeling : _bprinciples and applications / _cWay Kuo, Ming J. Zuo |
| 264 | 1 |
_aHoboken, New Jersey : _bJ. Wiley, _cc2003 |
|
| 300 |
_axvi, 544 páginas : _bilustraciones |
||
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 650 | 0 |
_aConfiabilidad (Ingeniería) _xModelos matemáticos |
|
| 700 | 1 |
_aZuo, Ming J., _eautor |
|
| 999 |
_c31114 _d31114 |
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