| 000 | 00887nam a2200241zi 4500 | ||
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| 005 | 20220228104930.0 | ||
| 008 | 970106s1992 a 000 0 eng | ||
| 020 | _a0890065802 | ||
| 035 | _aMX001000662349 | ||
| 050 |
_aTK7888.4 _bR35 |
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| 100 | 0 |
_aRajsuman, Rochit, _eautor |
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| 245 | 1 | 0 |
_aDigital hardware testing : _btransistor-level fault modeling and testing / _cRochit Rajsuman |
| 264 | 1 |
_aBoston : _bArtech, _cc1992 |
|
| 300 | _axv, 317 páginas | ||
| 490 | 0 | _aArtech House telecommunicationslibrary | |
| 650 |
_aComputadoras electrónicas digitales _xCircuitos _xPruebas _xProcesamiento de datos |
||
| 650 |
_aCircuitos integrados en muy gran escala _xPruebas _xProcesamiento de datos |
||
| 650 | _aComputación tolerante a fallas | ||
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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