| 000 | 01324nam a2200253zi 4500 | ||
|---|---|---|---|
| 005 | 20220228104920.0 | ||
| 008 | 970106s1992 a 000 0 eng d | ||
| 020 | _a0818629851 | ||
| 035 | _aMX001000642272 | ||
| 050 |
_aTA401.3 _bA75 1992 |
||
| 111 | 0 |
_aAsian Test Symposium _d(1992 : _cHiroshima, Japon) |
|
| 245 | 1 | 0 |
_aProceedings First asian test symposium (ATS'92) : _bnovember 26-27, 1992 Hiroshima , Japan / _csponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with Special Interest Group on Design Automation Information Processing Society of Japan, Technical Group on Fault Tolerant Systems IEICI, Japan Society for the Promotion of Science, 132nd committteee (Electron and Ion Beam Science and Technology) |
| 264 | 1 |
_aLos Alamitos California : _bIEEE Computer Society, _c1992 |
|
| 300 | _a259 páginas | ||
| 650 |
_aPruebas _vCongresos |
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| 710 | _aTechnical Group on Fault Tolerant Systems IEICI | ||
| 710 | _aIEEE Computer Society Test Technology Technical Committee | ||
| 710 |
_aJapan Society for the Promotion of Science. _b132nd Committee |
||
| 710 | _aGroup on Design Automation Information Processing Society of Japan | ||
| 336 |
_atexto _2rdacontent |
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| 337 |
_asin medio _2rdamedia |
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| 338 |
_avolumen _2rdacarrier |
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| 999 |
_c22938 _d22938 |
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