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_aMicroelectronic reliability / _c[ed by] Edward b. hakim |
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_aNorwood, massachusetts : _bArtech, _c198- |
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| 300 | _avolúmenes | ||
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_aSemiconductores _xConfiabilidad |
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_aHakim, Edward B., _eeditor |
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_atexto _2rdacontent |
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_asin medio _2rdamedia |
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