Tan, Cher Ming,  1959-, <br/><br/>
Electromigration in ULSI Interconnections / 
Cher Ming Tan 
 - xix, 291 páginas :  ilustraciones 
 - International series on advances in solid state electronics and technology .
<br/><br/><label>ISBN: </label>9789814273329 9814273325 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuitos integrados--Ultra integración a gran escala<br/>Electrodifusión
<br/><br/><label>LC Class. No.: </label>TK7874.76  / T35