TY  - BOOK
ED  - Asian Test Symposium
ED  - Technical Group on Fault Tolerant Systems IEICI
ED  - IEEE Computer Society Test Technology Technical Committee
ED  - Japan Society for the Promotion of Science.
ED  - Group on Design Automation Information Processing Society of Japan
TI  - Proceedings First asian test symposium (ATS'92): november 26-27, 1992 Hiroshima , Japan 
SN  - 0818629851
AV  - TA401.3 A75 1992
PY  - 1992///
CY  - Los Alamitos California
PB  - IEEE Computer Society
KW  - Pruebas
KW  - Congresos
ER  -