Proceedings First asian test symposium (ATS'92) :  november 26-27, 1992 Hiroshima , Japan / 
sponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with Special Interest Group on Design Automation Information Processing Society of Japan, Technical Group on Fault Tolerant Systems IEICI, Japan Society for the Promotion of Science, 132nd committteee (Electron and Ion Beam Science and Technology) 
 - 259 páginas 
<br/><br/><label>ISBN: </label>0818629851 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Pruebas--Congresos
<br/><br/><label>LC Class. No.: </label>TA401.3  / A75 1992